Mahr MarSurf XCR 20

** Please contact us for pricing & details. Online orders will not be accepted.

 

Roughness and contour measurement at a measuring station with MarSurf XCR 20

This combined measuring station allows both surface roughness and

contour measurements to be performed at a single measuring station.

Depending on the measuring task, either the GD 25 drive unit for surface roughness measurements or the PCV drive unit for contour measurements can be activated.

The two measuring systems are fixed to the measuring stand by means of a combi holder.

  • Space-saving design: the two drive units can be adapted by means of the corresponding combi holder to MarSurf ST 500 or ST 750 measuring stands
  • Roughness and contour evaluation from a single measurement
  • High-precision contour and roughness evaluation on components requiring a long stroke and very high resolution with the MarSurf LD 130 / LD 260 measuring system
  • Quick changeover between roughness and contour measurement simply by switching within the software platform and swapping mechanical components such as the drive unit and probe

 

Specification

( Download data sheet)

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